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Past Events
All times are listed in Eastern Standard Time (EST)

December 11, 2025
9:00 AM–10:00 AM — Preventive Maintenance of Balances & Scales (Mettler Toledo)

Learn why preventive maintenance is essential for balances, reducing downtime and ensuring long‑term accuracy.

10:00 AM–11:00 AM — Thermal Analysis of Phase Change Materials (Mettler Toledo)

Explore how DSC, TGA, TMA, and DMA techniques characterize phase change materials for energy storage applications.

11:00 AM–12:00 PM — Raman/PL Deployment as a Characterization/Metrology Tool for Semiconductors (Horiba)

Learn how Raman and photoluminescence microscopies support strain analysis, defect detection, and wafer mapping to optimize semiconductor processes.

 

December 10, 2025
11:00 AM–12:00 PM — WAX Column Technology Updates (Agilent)

Explore new WAX column innovations designed for demanding GC and GC/MS applications.

1:00 PM–2:00 PM — Bring Your Pipetting Results to the Next Level (Mettler Toledo)

Improve pipetting workflows with ergonomic techniques and routine calibration practices.

 

​December 6, 2025

6:00 PM- 7:00 PM — Streamlining SEM Workflows with Neo Action (JEOL)

Discover how the JSM‑IT810’s Neo Action automates multi‑field SEM observation and EDS analysis for high‑throughput, consistent semiconductor data.

 

​December 4, 2025
10:00 AM–11:00 AM — From Size to Surface: Unlocking Particle Performance with Mastersizer and TriStar (Malvern Panalytical)

Discover how combining particle size and surface area measurements improves formulation, reactivity, dissolution, and overall material performance.

11:00 AM–12:00 PM — Deep Dive into Online Chlorine Monitoring (Hach)

Explore chlorine monitoring technologies and the CL17sc analyzer to optimize reliability, reduce costs, and ensure safe, high‑quality water.'

December 3, 2025
9:00 AM–10:00 AM — Karl Fischer Titration Tips (Metrohm)

Learn best practices for accurate Karl Fischer titrations, including oven techniques and electrode care.

10:00 AM–11:00 AM — Making XRF Easy: Smarter Tools (Bruker)

Discover modern XRF tools that deliver faster, more accurate results across industries.

10:00 AM–11:00 AM — Differentiating PFAS Sources Using Orbitrap‑IRMS (Thermo Fisher)

Learn how Orbitrap‑IRMS enables advanced isotope fingerprinting to identify and apportion PFAS sources in environmental chemistry.

1:00 PM–2:00 PM — Inline Raman: Avoid Product Mix-Ups (ACS)

See how inline Raman prevents costly product errors in manufacturing workflows.

1:30 PM–2:30 PM — Unlocking Geological Secrets: Advanced Mineral Analysis and 3D Imaging with Raman Microscopy (Horiba)

Explore how advanced Raman microscopy enables mineral analysis and 3D imaging to reveal geological structures and composition.

2:00 PM–3:00 PM — Routine Testing of Balances and Scales (Mettler Toledo)

Learn routine testing methods to maintain compliance and ensure weighing accuracy.

December 2, 2025
12:00 PM–1:00 PM — On-Line Zeta Potential Monitoring (ACS)

Learn how continuous zeta potential monitoring improves water treatment and jar testing.

12:00 PM–1:00 PM — Raman Spectroscopy for Acid Gas Loading (Horiba)

Explore how HORIBA’s innovative Raman spectroscopy provides real‑time, accurate, and non‑destructive measurements of acid gas loading.

2:00 PM–3:00 PM — Preventive Maintenance of Balances and Scales (Mettler Toledo)

Understand the benefits of preventive maintenance for balances to ensure accuracy and reliability.

2:30 PM–3:30 PM — Advanced ICP-MS Applications: Single Cell & Nanoparticles (Agilent)

Explore cutting‑edge ICP‑MS techniques for nanoparticle, single cell, and laser ablation analysis.

November 27, 2025
11:00 AM–12:00 PM — Quantifying Historic Pesticide Residues with micro-XRF (Bruker)

Discover workflows for quantifying pesticide residues on heritage collections using micro‑XRF.

 

November 26, 2025
5:00 AM–6:00 AM — Revolutionary XRF in Action: Live with Revontium (Bruker)

Watch a live demo of Revontium XRF, covering features, performance, example measurements, and Q&A with the product manager.

 

November 25, 2025
11:30 PM–1:30 AM — MALDI Basic Webinar (Bruker)

Learn MALDI fundamentals, imaging applications, and polymer analysis with Bruker’s neofleX platform.

 

November 20, 2025
10:00 AM–11:00 AM — Sorption Analysis by Thermal Analysis (Mettler Toledo)

Understand moisture effects, calibration, and practical sorption applications using TGA, TMA, and DMA.

10:00 AM–11:00 AM — Best Practices for HPLC Column Care (Agilent)

Learn cleaning, storage, and troubleshooting techniques to extend HPLC column lifetime.

11:00 AM–12:00 PM — LC-MS Troubleshooting: From Frustration to Fix (Chromacademy)

Explore solutions for ionization, calibration, and sensitivity issues in LC‑MS workflows.

November 19, 2025
9:00 AM–10:00 AM — Converting Manual to Automatic Titration (Metrohm)

Learn how modern titrators streamline validation and improve accuracy compared to manual titrations.

10:30 AM–11:30 AM — High‑resolution Particle Size & Concentration with Zetasizer Advance (Malvern Panalytical)

See how MADLS enables accurate particle size and concentration measurements, with practical workflows in ZS Xplorer.

1:00 PM–2:00 PM — Open Office Hours: IC Troubleshooting (Metrohm)

Get expert answers to ion chromatography challenges, from data quality to instrument maintenance.

2:00 PM–3:00 PM — The Power of Connections (ACS Women Chemists Committee)

Hear how chemists leverage professional networks to overcome career challenges and foster inclusion.

 

November 18, 2025

10:00 AM–10:30 AM — A Guide to FT‑IR‑based Gas Analysis (Bruker)

Learn calibration‑free FT‑IR workflows for real‑time gas quantification in emissions testing, quality control, and environmental monitoring.

10:00 AM–11:00 AM — Structural Analysis of Battery Components and Materials Using XRD, XRM / Micro‑CT and EBSD (Bruker)

Explore how XRD, EBSD, and 3D XRM techniques provide detailed insights into battery materials, enabling innovation in energy storage.

10:00 AM–11:00 AM — Beyond Size: Exploring Surface Area in Particle Characterization (Malvern Panalytical)

Discover why surface area is critical beyond particle size, and how advanced measurement improves reactivity, dissolution, and formulation performance.

11:00 AM–12:00 PM — Carrier Gas Conundrum: Smart Solutions for Helium Alternatives (Agilent)

Evaluate hydrogen and nitrogen as cost‑effective, sustainable alternatives to helium in gas chromatography workflows.

11:00 AM–12:00 PM — Power Through the Mess: Robust LC‑MS/MS for Difficult Matrices (Agilent)

Learn LC‑MS/MS strategies for complex food and environmental samples, with contamination‑resistant design for reliable quantitation.

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