List View
All times are listed in Eastern Standard Time (EST)
December 2, 2025
12:00 PM–1:00 PM — On-Line Zeta Potential Monitoring (ACS)
Learn how continuous zeta potential monitoring improves water treatment and jar testing.
2:00 PM–3:00 PM — Preventive Maintenance of Balances and Scales (Mettler Toledo)
Understand the benefits of preventive maintenance for balances to ensure accuracy and reliability.
2:30 PM–3:30 PM — Advanced ICP-MS Applications: Single Cell & Nanoparticles (Agilent)
Explore cutting‑edge ICP‑MS techniques for nanoparticle, single cell, and laser ablation analysis.
December 3, 2025
9:00 AM–10:00 AM — Karl Fischer Titration Tips (Metrohm)
Learn best practices for accurate Karl Fischer titrations, including oven techniques and electrode care.
10:00 AM–11:00 AM — Making XRF Easy: Smarter Tools (Bruker)
Discover modern XRF tools that deliver faster, more accurate results across industries.
10:00 AM–11:00 AM — Differentiating PFAS Sources Using Orbitrap‑IRMS (Thermo Fisher)
Learn how Orbitrap‑IRMS enables advanced isotope fingerprinting to identify and apportion PFAS sources in environmental chemistry.
1:00 PM–2:00 PM — Inline Raman: Avoid Product Mix-Ups (ACS)
See how inline Raman prevents costly product errors in manufacturing workflows.
Explore how advanced Raman microscopy enables mineral analysis and 3D imaging to reveal geological structures and composition.
2:00 PM–3:00 PM — Routine Testing of Balances and Scales (Mettler Toledo)
Learn routine testing methods to maintain compliance and ensure weighing accuracy.
December 4, 2025
10:00 AM–11:00 AM — From Size to Surface: Unlocking Particle Performance with Mastersizer and TriStar (Malvern Panalytical)
Discover how combining particle size and surface area measurements improves formulation, reactivity, dissolution, and overall material performance.
11:00 AM–12:00 PM — Deep Dive into Online Chlorine Monitoring (Hach)
Explore chlorine monitoring technologies and the CL17sc analyzer to optimize reliability, reduce costs, and ensure safe, high‑quality water.'
December 6, 2025
6:00 PM- 7:00 PM — Streamlining SEM Workflows with Neo Action (JEOL)
Discover how the JSM‑IT810’s Neo Action automates multi‑field SEM observation and EDS analysis for high‑throughput, consistent semiconductor data.
December 10, 2025
11:00 AM–12:00 PM — WAX Column Technology Updates (Agilent)
Explore new WAX column innovations designed for demanding GC and GC/MS applications.
1:00 PM–2:00 PM — Bring Your Pipetting Results to the Next Level (Mettler Toledo)
Improve pipetting workflows with ergonomic techniques and routine calibration practices.
December 11, 2025
9:00 AM–10:00 AM — Preventive Maintenance of Balances & Scales (Mettler Toledo)
Learn why preventive maintenance is essential for balances, reducing downtime and ensuring long‑term accuracy.
10:00 AM–11:00 AM — Thermal Analysis of Phase Change Materials (Mettler Toledo)
Explore how DSC, TGA, TMA, and DMA techniques characterize phase change materials for energy storage applications.
11:00 AM–12:00 PM — Raman/PL Deployment as a Characterization/Metrology Tool for Semiconductors (Horiba)
Learn how Raman and photoluminescence microscopies support strain analysis, defect detection, and wafer mapping to optimize semiconductor processes.
December 16, 2025
11:00 AM–12:00 PM EST — Up to 40% Faster Automated TEM Lamella Preparation with Tescan Orage™ 2 Ga⁺ FIB Column (Tescan)
Discover how higher milling speed, beam stability, and low keV image clarity simplify and accelerate TEM lamella preparation
3:30 PM–4:30 PM — Analysis of Aqueous Environmental Samples Using UV‑Vis Instrumentation (Agilent)
Discover practical UV‑Vis workflows and methods for analyzing environmental water samples using the Cary 60.
December 17, 2025
10:00 AM–11:00 AM — HPLC Holiday Special: Proper Downtime Maintenance (Agilent)
Discover best practices for shutting down and restarting HPLC instruments during holiday downtime to avoid costly issues.
1:00 PM–2:00 PM — Accurate and Reliable Elemental Speciation (PerkinElmer)
Learn how NexSAR HPLC and NexION ICP‑MS deliver precise speciation results for food, beverage, and environmental samples.
December 18, 2025
2:00 PM–3:00 PM — Microplastics Identification: Tips & Tricks Workshop (Agilent)
Learn LDIR workflows, sample prep, and practical tips for rapid microplastics identification and reporting.
December 22, 2025
3:00 PM–4:00 PM — Solid State NMR with Fast MAS (Bruker)
Understand how ultra‑fast MAS improves resolution and enables advanced solid‑state NMR experiments in materials and pharma.
January 6, 2026
3:30 PM–4:30 PM — Elemental Analysis of Alloy Samples on an Agilent ICP‑OES (Agilent)
Learn how Agilent ICP‑OES overcomes spectral interferences and handles wide dynamic ranges to accurately quantify alloy composition for optimized mechanical properties.
January 8, 2026
10:00 AM–11:00 AM — Characterization of Composite Materials by Thermal Analysis (Mettler Toledo)
Learn how DSC, TGA, and DMA techniques reveal composite structure and performance in real‑world applications.
11:00 AM–12:00 PM — The Right Liner for the Right Method: GC Inlet Essentials (Agilent)
Discover how selecting the correct GC liner improves separation, reduces troubleshooting, and saves valuable lab time.
January 13, 2026
3:30 PM–4:30 PM — The Importance of Controlling Contamination and Choosing the Right Sample Introduction System Even Before You Start Your Analysis to Achieve the Best Detection Limits (Agilent)
Learn how minimizing environmental contamination and selecting the right ICP‑MS sample introduction system upfront enables the lowest detection limits and more reliable data.
January 15, 2026
2:00 PM–3:00 PM — Effortless UV‑VIS Analysis with Long Pathlength Measurements (Agilent)
Learn how long‑pathlength cuvettes improve UV‑VIS sensitivity and detection limits, with flexible sampling on the Cary 3500 for effortless concentration analysis.
January 20, 2026
11:00 AM–12:00 PM — What’s Really Happening in Your Column: How Secondary Interactions Happen and What We Can Do about Them (Agilent)
Understand secondary interactions in HPLC, how they affect peak shape and resolution, and practical ways to mitigate them using mobile phase modifiers and inert LC column technology.
January 22, 2026
2:00 PM–3:00 PM — Tips and Tricks Workshop on ICP-OES (Agilent)
Gain practical strategies for tuning ICP‑OES methods to achieve optimal sensitivity and detection limits.
January 27, 2026
3:30 PM–4:30 PM — Measuring Diffuse Powders and Films With UV‑VIS‑NIR (Agilent)
Learn how diffuse reflectance accessories (DRAs) and Agilent’s universal measurement accessory (UMA) enable accurate UV‑VIS‑NIR measurements for scattering samples, capturing full reflected light and angular distributions for reliable results.
January 28, 2026
9:00 AM–10:00 AM — Combining Data-Rich Experimentation with Modeling (ACS / Industry Experts)
See case studies on how kinetic modeling and data‑rich experimentation drive productivity in chemical R&D.
January 29, 2026
10:00 AM–11:00 AM — Thermal Analysis of Electronic Components (Mettler Toledo)
Learn how thermal techniques like DSC and TGA are applied to electronics and PCB reliability testing.
We aim to add events 2-3 months in advance, but we are limited by vendor postings. Check back in a couple weeks for more listings!